Beyond Linear Depth Scaling: Diagnosing Piecewise Layer Reliability for Data-Free Model Merging (DIAL)

Published in Submitted to NeurIPS 2026, 2026

Recommended citation: X. Wang, K. Deng, F. Dou, J. Bi, J. Lu. Beyond Linear Depth Scaling: Diagnosing Piecewise Layer Reliability for Data-Free Model Merging (DIAL). Submitted to NeurIPS 2026.